Wafer Inspection Systems
Wafer Inspection and Mapping Systems Custom Projects and System Solutions
ASI has designed a number of different systems for wafer inspection, mapping, and custom applications.
Our core competencies include:
- Ultra precise motion control and micropositioning
- Automation including wafer handling, microscopes, and micromanipulation
- Auto focus algorithms
- Microscopy, Fluorescence microscopy, Video microscopy
- Illumination control including deep UV systems to detect the presence of residual Deep UV or I-Line photoresist on silicon wafers.
- Mechanical design & custom machining
- Imaging, CCD & Video cameras
- Programming
If you have a routine or challenging project, please contact us for further details on the services that we can offer.
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Events / Tradeshows
Biophysical Society 56th Annual Meeting - Booth #611 - February 25-29, 2012, San Diego, CADPG Berlin - March 25-30, 2012, Berlin, Germany (OptoPhase)SPIE Photonics Europe - April 16-19, 2012, Brussels, Belgium (Optophase)Analytica - April 17-20, 2012, Munich, Germany (Optophase)Experimental Biology 2012 - Booth #830 - April 22 - 24, 2012, San Diego, CAEMRS 2012 Spring Meeting - May 15-17, 2012, Strasbourg, France (Optophase)FENS 2012 - July 14-18, 2012, Barcelona, Spain (Optophase)European Microscopy Congress (EMC 2012) - Booth #315 - September 16 - 21, 2012, Manchester Central, UKCopyright © Applied Scientific Instrumentation 2001 - 2012. All rights reserved.