Applied Scientific Instrumentation (ASI)
CRIFF Continuous Reflective
Interface Focus Feedback System
New Product Announcement
CRIFF Continuous Reflective
Interface Focus Feedback System
New Product Announcement
November 2005
ASI's CRIFF Continuous Reflective-Interface Focus Feedback System
The CRIFF system provides for a very high level of focus stability, allowing a specimen to remain accurately focused for hours at a time with less than 100 nanometers of drift. The system compensates for focus changes caused by temperature variations as well as mechanical drifts of the microscope mechanisms.

The CRIFF substantially eliminates focus drift in high power microscopy by effectively monitoring the distance between the objective lens and the specimen's cover slip. Minute changes in the distance between the specimen and the objective lens are sensed using an optical detector. This detector provides a feed back signal for the closed-loop positioning system which actively controls the focus of the microscope.

For more information, click here to visit its web page.

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